Phase Methods of Fringe Pattern Analysis (Keynote Lecture)
by
Malgorzata Kujawinska
Institute of Micromechanics and Photonics Warsaw University of Technology, Chodkiewicza 8, 02-525 Warszawa, Poland

The recent success in implementation of optical full-field measuring methods into industrial, medical and commercial areas depends on automatic analysis of their output i.e. fringe patterns, FP. The demands for recent modern systems are to retrieve a measurand coded in a fringe pattern faster, more accurate and reliable and more communicative towards other systems such as CAD/CAM, FEM, computer graphics etc. The paper is intended to be a review of fringe pattern analysis methods and their capabilities to analyse extended class of FP. The special emphasis is paid to phase (active) methods which require phase modification of a fringe pattern by introducing alternatively such controlled parameters as: temporal and spatial carrier frequency and phase shifts. More detailed description is given to the most commonly used methods, namely temporal and spatial phase shifting methods, as well as to the hybrid concept of spatio-temporal analysis for multiply and variable in time objects. The fringe pattern analysis process is considered in respect to three main stages: determination of phase modulo 2pi, phase unwrapping and phase scaling. The main trends in development of phase methods and algorithms together with comparison of their capabilities are presented. The methods are illustrated by numerous examples of analysis of fringe patterns delivered by shape, displacement and deformation measuring systems.

Date received: February 17, 1999

Copyright © 1999 by the author(s). The author(s) of this document and the organizers of the conference have granted their consent to include this abstract in Atlas Conferences Inc. Document # cacp-57.