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International Conference on Statistics, Combinatorics and Related Areas - 7th International Conference of the Forum for Interdisciplinary Mathematics
December 19-21, 2000
Indian Institute of Technology-Bombay
Mumbai, Maharastra, India

Organizers
Satya N. Mishra (University of South Alabama), Sanjeev V. Sabnis (IIT, Bombay)

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A Reliability Test Plan for Series Systems with Time Dependent Failure Rate
by
J. Hariharan Nair
Department of Mathematics, Indian Institute of Technology-Bombay, India
Coauthors: Sanjeev V Sabnis (Indian Institute of Technology-Bombay, India)

In almost all studies related to the construction of optimal reliability test plans, the lifetimes of the components are assumed to have constant failure rates. This work deals with the construction of optimal reliability test plan for a series system comprising of components whose lifetimes have failure rates which vary with time. In other words, the components are assumed to fail according to a non-homogeneous Poisson process with an appropriate mean value function.

Date received: November 14, 2000

Copyright © 2000 by the author(s). The author(s) of this document and the organizers of the conference have granted their consent to include this abstract in Atlas Conferences Inc. Document # cafx-04.