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SCRA 2002-FIM IX: Ninth International Conference of Forum for Interdisciplinary Mathematics on Statistics Combinatorics and Related Areas
December 21-23, 2002
Department of Statistics and Department of Mathematics: University of Allahabad
Allahabad, UP, India

Organizers
Satya Mishra, Anoop Chaturvedi, Bhu Dev Sharma

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Bayesian Estimation of Reliability via Length Biased Exponential Distribution
by
Jyoti Kumar Gaur
Department of Mathematics & Statistics, DDU Gorakhpur University, Gorakhpur
Coauthors: R.S. Srivastava (DDU Gorakhpur University, Gorakhpur), Vijay Kumar (DDU Gorakhpur University, Gorakhpur)

In this article, an attempt has been made to obtain Bayes estimators of the reliability function of exponential lifetime distribution via length bised exponential distribution under different priors using symmetric as well as various asymmetric loss functions. The performance of the estimators has also been studied with Monte-Carlo samples.

Date received: November 16, 2002

Copyright © 2002 by the author(s). The author(s) of this document and the organizers of the conference have granted their consent to include this abstract in Atlas Conferences Inc. Document # cakd-23.