Dynamic Response and Stability Testing of the Excited Photocurrent Inside the Optoelectronic Integrated Device (OEID)
by
Shaban Marzouk Eladl
NCRRT
Coauthors: Mohamed B. El_Mashade, M. Ashry, Sh. M. Eladl, M. S. Rageh

In this paper, the transient response of the excited photocurrent inside an Optoelectronic Integrated Device (OEID) is analyzed. The device is composed of a Hetrojunction Phototransistor (HPT) and a Laser Diode (LD). The expressions describing the transient response of the output, the rise time, and the output derivative are derived. The effect of the various device parameters on the transient response is outlined. The results show that the transient response of these types of devices is strongly depend on the optical feedback inside the device and it is found that the device works in two different modes, which are: amplification, for small optical feedback coefficient, switching, for high optical feedback coefficient. Also the excited photocurrent inside these types of devices is stable as long as the optical feedback is below threshold value, while exhibits instability for values of optical feedback greater or equal to this threshold value. This type of model can be exploited as an optical amplifier, optical switching device and other applications.

Date received: January 11, 2004

Copyright © 2004 by the author(s). The author(s) of this document and the organizers of the conference have granted their consent to include this abstract in Atlas Conferences Inc. Document # calu-56.