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First International Workshop in Sequential Methodologies (IWSM 2007)
July 22-25, 2007
Auburn University
Auburn, AL, U.S.A.

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Corrected confidence intervals based on the signed root transformation for multi-parameter models
by
Steve Coad
Queen Mary, University of London, U.K.
Coauthors: Michael Woodroofe

A two-parameter model is studied in which there is a parameter of interest and a nuisance parameter. Corrected confidence intervals are constructed for the parameter of interest for data from a sequentially designed experiment. This is achieved by considering the distribution of the first component of the bivariate signed root transformation, and then by applying a version of Stein's identity and very weak expansions to determine the correction terms. The accuracy of the approximations is assessed by simulation for a variety of examples. An extension of the approach to higher dimensions is briefly discussed.

Date received: April 13, 2007


Copyright © 2007 by the author(s). The author(s) of this document and the organizers of the conference have granted their consent to include this abstract in Atlas Conferences Inc. Document # cauc-64.