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Host: The University of Dundee
Homepage: http://www.iop.org/IOP/Confs/EMAG/
Description:
The aim of this bi-annual conference is to bring together international academics and industrialists in science and
engineering, who employ electron and scanning probe microscopies, together with associated techniques such as
surface analysis, in both imaging and analytical applications. All aspects of Electron and Scanning Probe
Microscopy/Spectroscopy including current issues in this field will be highlighted and discussed, including:
New Instrumentation (emphasis on Field Emission Systems), Imaging and Analytical Techniques High Resolution Electron Microscopy and Electron Crystallography Advanced SEM, Scanning Probe Microscopy and Surface Science Advances in Microanalysis and Elemental/Chemical Imaging Microscopy of Catalysts, Sensors and Environmental Materials Ferrous/Non-ferrous Metals and Intermetallics Carbons, Ceramics, Electroceramics and Composites Semiconductors, Superconductors and Magnetic Materials Sample Preparation Microscopy of Interfaces and Surfaces
Date received: November 13, 2000
© 2008 Atlas Conferences Inc.